IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing

Proceedings International Test Conference 1997

Author(s): Venkataraman, S. ; Fuchs, W.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 878 - 886
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639702
Regular:

A diagnosis technique that integrates the storage of precomputed information with some dynamic computation for the diagnosis of bridging faults in synchronous sequential circuits with no-scan or... View More

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