IEEE - Institute of Electrical and Electronics Engineers, Inc. - DS-LFSR: a new BIST TPG for low heat dissipation

Proceedings International Test Conference 1997

Author(s): Seongmoon Wang ; Gupta, S.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 848 - 857
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639699
Regular:

A test pattern generator (TPG) for built-in self-test (BIST), which can reduce heat dissipation during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS-LFSR), consists... View More

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