IEEE - Institute of Electrical and Electronics Engineers, Inc. - BART: a bridging fault test generator for sequential circuits

Proceedings International Test Conference 1997

Author(s): Cusey, J.P. ; Patel, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 838 - 847
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639698
Regular:

The need for test generation tools which target bridging faults in addition to stuck-at faults is growing. This work introduces BART, a new bridging-fault-targeted test; generator based... View More

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