IEEE - Institute of Electrical and Electronics Engineers, Inc. - How seriously do you take possible-detect faults?

Proceedings International Test Conference 1997

Author(s): Raina, R. ; Njinda, C. ; Molyneaux, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 819 - 828
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639696
Regular:

Digital designs, implemented in CMOS technology, have increasingly used tri-state logic (pass gates) to increase clock speed. It is also known that tri-state logic based designs have poor... View More

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