IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low current and low voltages-the high-end op amp testing challenge

Proceedings International Test Conference 1997

Author(s): Cometta, B. ; Witte, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 796 - 801
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639693
Regular:

State-of-the-art op amps with input bias currents in the fA range and offset voltages of several /spl mu/V present special test problems. The authors discuss the measurement problems and their... View More

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