IEEE - Institute of Electrical and Electronics Engineers, Inc. - Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

Proceedings International Test Conference 1997

Author(s): Arabi, K. ; Kaminska, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 786 - 795
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639692
Regular:

This paper describes a new built-in self test (BIST) technique suitable for both functional and structural testing of analog and mixed-signal circuits based on the oscillation-test methodology.... View More

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