IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-chip measurement of the jitter transfer function of charge-pump phase-locked loops

Proceedings International Test Conference 1997

Author(s): Veillette, B.R. ; Roberts, G.W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 776 - 785
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639691
Regular:

An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two methods. Both rely on... View More

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