IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental results for current-based analog scan

Proceedings International Test Conference 1997

Author(s): Soma, M. ; Bocek, T.M. ; Vu, T.D. ; Moffatt, J.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 768 - 775
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639690
Regular:

This paper presents the design of current-mode circuits for analog scan, which include the highly accurate current-mirror scan latches and the analog shift registers. Experimental data from a test... View More

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