IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scan synthesis for one-hot signals

Proceedings International Test Conference 1997

Author(s): Mitra, S. ; Avra, L.J. ; McCluskey, E.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 714 - 722
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639684
Regular:

Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot signals. In a... View More

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