IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parameterizable testing scheme for FIR filters

Proceedings International Test Conference 1997

Author(s): Mukherjee, N. ; Rajski, J. ; Tyszer, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 694 - 703
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639682
Regular:

This paper presents a new pseudo-exhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed in a built-in self-test (BIST) environment to... View More

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