IEEE - Institute of Electrical and Electronics Engineers, Inc. - OLDEVDTP: a novel environment for off-line debugging of VLSI device test programs

Proceedings International Test Conference 1997

Author(s): Yuhai Ma ; Wanchun Shi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 675 - 684
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639680
Regular:

Today's microelectronics researchers design VLSI devices to achieve highly differentiated devices, both in performance and functionality. As VLSI devices become more complex, VLSI device testing... View More

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