IEEE - Institute of Electrical and Electronics Engineers, Inc. - A DSP-based feedback loop for mixed-signal VLSI testing

Proceedings International Test Conference 1997

Author(s): Prabhu, L.S. ; Rosenthal, D.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 670 - 674
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639679
Regular:

Implementing a feedback loop system for a mixed-signal VLSI test system by using an embedded digital signal processing (DSP) unit provides superior flexibility in device testing applications. This... View More

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