IEEE - Institute of Electrical and Electronics Engineers, Inc. - Memory test-debugging test vectors without ATE

Proceedings International Test Conference 1997

Author(s): Westfall, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 663 - 669
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639678
Regular:

A method for debugging functional production test vectors for memory devices without the use of Automated Test Equipment (ATE) is presented. The method described involves the use of a digital... View More

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