IEEE - Institute of Electrical and Electronics Engineers, Inc. - System level boundary scan in a highly integrated switch

Proceedings International Test Conference 1997

Author(s): Hughes, W.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 636 - 639
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639673
Regular:

JTAG and continuity testing can only go so far at a board or module testing level. When all of the pieces come together, employing boundary scan (IEEE 1149.1) techniques at a system level can... View More

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