IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical communication channel test using BIST approaches

Proceedings International Test Conference 1997

Author(s): Gaganon, M. ; Kaminska, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 626 - 635
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639672
Regular:

Novel Built-In Self-Test (BIST) approaches for integrated optoelectronic systems are presented The methods are compatible with scan chain design and allow testing the internal functionality of the... View More

Advertisement