IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test strategy sensitivity to defect parameters

Proceedings International Test Conference 1997

Author(s): Renovell, M. ; Bertrand, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 607 - 616
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639669
Regular:

This paper demonstrates that the detection of defect depends on two classes of parameters: the predictable and unpredictable parameters. The demonstration is made with two very different types of... View More

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