IEEE - Institute of Electrical and Electronics Engineers, Inc. - Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits

Proceedings International Test Conference 1997

Author(s): Konuk, H. ; Ferguson, F.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 597 - 606
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639668
Regular:

Shorts and opens are the most common types of defects in today's CMOS ICs. In this paper we show for the first time that an open in the interconnect wiring of a digital CMOS circuit can cause... View More

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