IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line testing scheme for clock's faults

Proceedings International Test Conference 1997

Author(s): Metra, C. ; Favalli, M. ; Ricco, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 587 - 596
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639667
Regular:

This paper proposes an on-line testing scheme for permanent and temporary faults which affect signals of the clock distribution network of synchronous systems, and which make them stuck-at, or... View More

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