IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design and realization of an accurate built-in current sensor for on-line power dissipation measurement and I/sub DDQ/ testing

Proceedings International Test Conference 1997

Author(s): Arabi, K. ; Kaminska, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 578 - 586
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639666
Regular:

Built-in current sensor (BICS) is known to enhance test accuracy, defect coverage and test rate of quiescent current (I/sub DDQ/) testing method in CMOS VLSI circuits. For new deep-submicron... View More

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