IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scan encoded test pattern generation for BIST

Proceedings International Test Conference 1997

Author(s): Kun-Han Tsai ; J. Rajski ; M. Marek-Sadowska
Sponsor(s): IEEE Comput. Soc. Test Technol. Tech. Committee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page Count: 9
Page(s): 548 - 556
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639663
Regular:

This paper presents an improved scan-based BIST scheme which achieves very high fault coverage without any modification of the mission logic, i.e. no test point insertion, no test data to store... View More

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