IEEE - Institute of Electrical and Electronics Engineers, Inc. - BIST-based diagnostics of FPGA logic blocks

Proceedings International Test Conference 1997

Author(s): Stroud, C. ; Lee, E. ; Abramovici, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 539 - 547
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639662
Regular:

Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance. In this paper we... View More

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