IEEE - Institute of Electrical and Electronics Engineers, Inc. - The search for the universal probe card solution

Proceedings International Test Conference 1997

Author(s): Bates, R.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 533 - 538
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639661
Regular:

Epoxy Ring, Cobra, and other new products are evaluated against the demand for high pin count, high frequency, high temperature, multi-DUT, long life, etc. There doesn't appear to be a single... View More

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