IEEE - Institute of Electrical and Electronics Engineers, Inc. - High-performance production test contactors for fine-pitch integrated circuit

Proceedings International Test Conference 1997

Author(s): Brandes, J.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 518 - 526
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639658
Regular:

This paper describes the design of two contactors intended for testing fine-pitch BGA devices, specifically 0.75 mm and 0.5 mm pitches. The design emphasis is on high performance and high-volume... View More

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