IEEE - Institute of Electrical and Electronics Engineers, Inc. - An on-line self-testing switched-current integrator

Proceedings International Test Conference 1997

Author(s): Abu-Shahla, O. ; Bell, I.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 463 - 470
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639652
Regular:

We describe a CMOS on-line-self-testing, double-sampled, fully-balanced, switched-current bilinear integrator. High spot-defect fault coverage of the integrator, clock generator and... View More

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