IEEE - Institute of Electrical and Electronics Engineers, Inc. - IC diagnosis: industry issues

Proceedings International Test Conference 1997

Author(s): Soden, J.M. ; Henderson, C.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639648
Regular:

A new failure analysis paradigm is necessary-a shift from hardware-based techniques to software-based methods. The transition is a daunting task because of its complexity. As with other successful... View More

Advertisement