IEEE - Institute of Electrical and Electronics Engineers, Inc. - Logical diagnosis solutions must drive yield improvement

Proceedings International Test Conference 1997

Author(s): Ryan, P.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639647
Regular:

The author discusses automated production-worthy solutions for high-volume manufacturing. He suggests that Design for Test (DFT) techniques such as scan (particularly full scan) provide design... View More

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