IEEE - Institute of Electrical and Electronics Engineers, Inc. - A case study of the test development for the 2nd generation ColdFire/sup R/ microprocessors

Proceedings International Test Conference 1997

Author(s): Amason, D. ; Crouch, A.L. ; Eisele, R. ; Giles, G. ; Mateja, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 424 - 432
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639645
Regular:

A case study of the development of the design for test methodology of the second generation of the ColdFire/sup R/ Microprocessor Family is described from the viewpoint of goals, initial strategy... View More

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