IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simplified polynomial-fitting algorithm for DAC and ADC BIST

Proceedings International Test Conference 1997

Author(s): Sunter, S.K. ; Nagi, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 389 - 395
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639641
Regular:

An accurate and simple method is introduced for determining the third order polynomial that best fits a set of data points containing random noise. The coefficients of the polynomial are... View More

Advertisement