IEEE - Institute of Electrical and Electronics Engineers, Inc. - Screening for known good die (KGD) based on defect clustering: an experimental study

Proceedings International Test Conference 1997

Author(s): Singh, A.D. ; Nigh, P. ; Krishna, C.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 362 - 369
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639638
Regular:

Die screening based on the locality of defects has long been informally practised in the industry whereby dice from wafers, or parts of the wafer, that display high defect levels are discarded.... View More

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