IEEE - Institute of Electrical and Electronics Engineers, Inc. - ASIC manufacturing test cost prediction at early design stage

Proceedings International Test Conference 1997

Author(s): Voo-Kyoung Kim ; Chen, T. ; Tegethoff, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 356 - 361
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639637
Regular:

This paper proposes a rest cost prediction model which estimates the cost of lC testing in a manufacturing environment. The model predicts chip testing cost and quality of test using a set of... View More

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