IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using BIST control for pattern generation

Proceedings International Test Conference 1997

Author(s): Kiefer, G. ; Wunderlich, H.-J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 347 - 355
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639636
Regular:

A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It takes advantage of... View More

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