IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test width compression for built-in self testing

Proceedings International Test Conference 1997

Author(s): Chakrabarty, K. ; Murray, B.T. ; Jian Liu ; Minyao Zhu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 328 - 337
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639634
Regular:

We present a method for designing test generator circuits (TGCs) that incorporate a precomputed test set to in the patterns they produce. Our method uses width compression based on the property of... View More

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