IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application and analysis of IDDQ diagnostic software

Proceedings International Test Conference 1997

Author(s): Nigh, P. ; Forlenza, D. ; Motika, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 319 - 327
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639633
Regular:

A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large database of defects uniquely detected with this test method. We present a... View More

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