IEEE - Institute of Electrical and Electronics Engineers, Inc. - Signature analysis for IC diagnosis and failure analysis

Proceedings International Test Conference 1997

Author(s): Henderson, C.L. ; Soden, J.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 310 - 318
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639632
Regular:

A method of signature analysis is presented that is based on ATE data, experiential knowledge of failure modes and mechanisms, or a combination of both. This method can be used on low numbers of... View More

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