IEEE - Institute of Electrical and Electronics Engineers, Inc. - The application of novel failure analysis techniques for advanced multi-layered CMOS devices

Proceedings International Test Conference 1997

Author(s): Yeoh Eng Hong ; We, M.T.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 304 - 309
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639631
Regular:

The major focus of this paper is on innovative fault localisation approaches that make use of DFT (design for testability) features, fanin tree, assembly code programming and functional model... View More

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