IEEE - Institute of Electrical and Electronics Engineers, Inc. - Manufacturing pattern development for the Alpha 21164 microprocessor

Proceedings International Test Conference 1997

Author(s): Stolicny, C. ; Davies, R. ; McKernan, P. ; Truong, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 278 - 285
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639628
Regular:

Functional test patterns play a key role in the test strategy of many microprocessors. This paper describes the process of creating and fault grading an initial set of functional test vectors. The... View More

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