IEEE - Institute of Electrical and Electronics Engineers, Inc. - H-SCAN+: a practical low-overhead RTL design-for-testability technique for industrial designs

Proceedings International Test Conference 1997

Author(s): Asaka, T. ; Bhattacharya, S. ; Dey, S. ; Yoshida, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 265 - 274
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639622
Regular:

H-SCAN (1996) was presented as a low overhead design-for-testability strategy which is applicable to RT-level controller-data path circuits. However, from the view-point of practical use,... View More

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