IEEE - Institute of Electrical and Electronics Engineers, Inc. - A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator

Proceedings International Test Conference 1997

Author(s): Singh, H. ; Patankar, G. ; Beausang, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 256 - 264
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639621
Regular:

The paper shows how to extract the boundary-scan circuitry from an IC (Integrated Circuit), verify its compliance to IEEE Std 1149.1 and generate its BSDL (Boundary Scan Description Language)... View More

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