IEEE - Institute of Electrical and Electronics Engineers, Inc. - A self-test circuit for evaluating memory sense-amplifier signal

Proceedings International Test Conference 1997

Author(s): Adams, R.D. ; Cooley, E.S. ; Hansen, P.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 217 - 225
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639617
Regular:

An on-chip self-test circuit to evaluate an analog sense-amplifier signal for static random-access memories was designed and analyzed. This circuit augments modern test equipment to achieve... View More

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