IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test requirements for embedded core-based systems and IEEE P1500

Proceedings International Test Conference 1997

Author(s): Zorian, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 191 - 199
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639613
Regular:

Chips comprising reusable cores, i.e. pre-designed Intellectual Property (IP) blocks, have become an important part of IC-based system design. Using embedded cores enables the design of... View More

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