IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analog and mixed-signal benchmark circuits-first release

Proceedings International Test Conference 1997

Author(s): Kaminska, B. ; Arabi, K. ; Bell, I. ; Goteti, P. ; Huertas, J.L. ; Kim, B. ; Rueda, A. ; Soma, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 183 - 190
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639612
Regular:

The IEEE Mixed-Signal Technical Activity Committee is developing a common set of benchmark circuits for use in researching and evaluating analog fault modeling, test generation, design-for-test,... View More

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