IEEE - Institute of Electrical and Electronics Engineers, Inc. - Current signatures: application

Proceedings International Test Conference 1997

Author(s): Gattiker, A.E. ; Maly, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 156 - 165
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639608
Regular:

Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under the condition that... View More

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