IEEE - Institute of Electrical and Electronics Engineers, Inc. - I/sub DDQ/ characterization in submicron CMOS

Proceedings International Test Conference 1997

Author(s): Ferre, A. ; Figueras, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 136 - 145
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639606
Regular:

The effectiveness of I/sub DDQ/ testing requires appropriate discriminability of defective and non-defective quiescent currents. Consequently, the interest in characterizing these currents is... View More

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