IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing the enterprise IBM System/390/sup TM/ multi processor

Proceedings International Test Conference 1997

Author(s): Torreiter, O.A. ; Baur, U. ; Goecke, G. ; Melocco, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 115 - 123
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639602
Regular:

This paper describes the test generation strategies, novel test generation techniques and the tester strategy for testing the IBM System/390/sup TM/ Generation-3 Enterprise System Multi-Processor... View More

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