IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing the 400 MHz IBM generation-4 CMOS chip

Proceedings International Test Conference 1997

Author(s): Foote, T.G. ; Hoffman, D.E. ; Huott, W.V. ; Koprowski, T.J. ; Robbins, B.J. ; Kusko, M.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 106 - 114
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639601
Regular:

This paper describes the design-for-test framework of the 400 MHz CMOS central processor (CP) used in the fourth generation (G4) of the IBM S/390(R) line of servers. It will describe details of... View More

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