IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simulation-based JTAG ATPG optimized for MCMS

Proceedings International Test Conference 1997

Author(s): Flint, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 101 - 105
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639600
Regular:

Boundary scan test generation tools generate tests based on the netlist of the design. Netlist-based tools are very efficient in designs with a high percentage of boundary scan devices, but can be... View More

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