IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modifying user-defined logic for test access to embedded cores

Proceedings International Test Conference 1997

Author(s): Pouya, B. ; Touba, N.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 60 - 68
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639594
Regular:

Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (UDL) surrounding the core may restrict the set of test vectors that can be applied to the... View More

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