IEEE - Institute of Electrical and Electronics Engineers, Inc. - A low overhead design for testability and test generation technique for core-based systems

Proceedings International Test Conference 1997

Author(s): Ghosh, I. ; Jha, N.K. ; Dey, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 50 - 59
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639593
Regular:

In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has several advantages... View More

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