IEEE - Institute of Electrical and Electronics Engineers, Inc. - Identification of defective CMOS devices using correlation and regression analysis of frequency domain transient signal data

Proceedings International Test Conference 1997

Author(s): Plusquellic, J.F. ; Chiarulli, D.M. ; Levitan, S.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 40 - 49
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639592
Regular:

Transient signal analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on I/sub DD/ switching transients on the supply rails.... View More

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