IEEE - Institute of Electrical and Electronics Engineers, Inc. - i/sub DD/ pulse response testing applied to complex CMOS ICs

Proceedings International Test Conference 1997

Author(s): Beasley, J.S. ; Righter, A.W. ; Apodaca, C.J. ; Pour-Mozafari, S. ; Huggett, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Washington, DC, USA, USA
Conference Date: 6 November 1997
Page(s): 32 - 39
ISBN (Paper): 0-7803-4209-7
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.1997.639591
Regular:

This paper presents test results for detecting defects in complex ICs by analyzing the changes observed in the power-on transient power supply currents for the IC. This test technique, called... View More

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